Abstract
Correlation and Fourier averaging are compared by analyzing 400 kV spot-scan electron images of ice-embedded gp32*I crystals from a previous study using correlation averaging and multivariate statistical analysis (MSA). Using correlation averaging, the crystal lattice distortions has been followed in different way compared to unbending commonly used in Fourier analysis.
| Original language | English (US) |
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| Pages | 106-107 |
| Number of pages | 2 |
| State | Published - 1994 |
| Externally published | Yes |
| Event | Proceedings of the 52nd Annual Meeting of the Microscopy Society of America - New Orleans, LA, USA Duration: Jul 31 1994 → Aug 5 1994 |
Other
| Other | Proceedings of the 52nd Annual Meeting of the Microscopy Society of America |
|---|---|
| City | New Orleans, LA, USA |
| Period | 7/31/94 → 8/5/94 |
ASJC Scopus subject areas
- General Engineering